1. EUV Sources for Lithography, Bakshi, V., Ed., SPIE Soc. of Photo-Optical Instrumentation Eng., 2005.
2. Schriever, G., Rahe, M., Stamm, U., et al., SPIE, 2001, vol. 4343, p. 615.
3. Stamm, U., Ahmad, I., Balogh, I., et al., SPIE, 2003, vol. 5037, p. 119.
4. Koshelev, K.N., Banin, V.E., and Salashchenko, N.N., Usp. Fiz. Nauk, 2007, vol. 177, p. 777.
5. Brandt, D.C., Fomenkov, I.V., Bowering, N.R., et al., Proc. SEMATECH EUVL Symp., Barcelona, 2006, Available from: http://www.sematech.org/meetings/archives/litho/7870/proceedings/oral/D2/3SO04%20Brandt.pdf