An X-ray fluorescence depth distribution function for electron beam microanalysis-Reference-Cited by-同舟云学术

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An X-ray fluorescence depth distribution function for electron beam microanalysis

Published:2010-07 Issue:7 Volume:74 Page:1002-1006
ISSN:1062-8738
Container-title:Bulletin of the Russian Academy of Sciences: Physics
language:en
Short-container-title:Bull. Russ. Acad. Sci. Phys.

Author:

Mikheev N. N.,Stepovich M. A.,Shirokova E. V.

Publisher

Allerton Press

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.3103/S1062873810070245.pdf

Reference15 articles.

1. Reed, S., Electron Microprobe Analysis, Cambridge (UK): Cambridge Univ., 1975.

2. Heinrich, K.F.J. and Newbury, D.E., Electron Probe Quantitation, New York: Plenum, 1991.

3. Shimizu, R., Nishigori, N., and Murata, R., in Proc. 6th Int. Conf. on X-Ray Optics and Microanalysis, Tokyo: Tokyo Univ., 1972, p. 95.

4. Mikheev, N.N. and Stepovich, M.A., Zavod. Lab., 1996, no. 4, p. 20.

5. Mikheev, N.N. and Stepovich, M.A., Mater. Sci. Eng., B, 1995, vol. 1–4, p. 11.

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