Two-Flux Model of Charged-Particle Transport in a Condensed Material under Multiple Scattering: Average Energy Losses and Range of a Beam of Monoenergetic Electrons with Energies of 0.1 keV−1.0 MeV-Reference-Cited by-同舟云学术

Two-Flux Model of Charged-Particle Transport in a Condensed Material under Multiple Scattering: Average Energy Losses and Range of a Beam of Monoenergetic Electrons with Energies of 0.1 keV−1.0 MeV

Published:2019-07 Issue:4 Volume:13 Page:719-726
ISSN:1027-4510
Container-title:Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
language:en
Short-container-title:J. Synch. Investig.

Author:

Mikheev N. N.

Publisher

Pleiades Publishing Ltd

Subject

Surfaces, Coatings and Films

Link

http://link.springer.com/content/pdf/10.1134/S1027451019040281.pdf

Reference18 articles.

1. N. N. Mikheev and M. A. Stepovich, Materials Sci. Engineering B 32 (1–2), 11 (1995).

2. N. N. Mikheev, Izv. Ross. Akad. Nauk, Ser. Fiz. 64 (11), 2137 (2000).

3. N. N. Mikheev, M. A. Stepovich, and S. N. Yudina, J. Surf. Invest.: X-Ray Synchrotron Neutron Tech. 3 (2), 218 (2009).

4. N. N. Mikheev, J. Surf. Invest.: X-Ray Synchrotron Neutron Tech. 4, 289 (2010).

5. N. N. Mikheev and A. S. Kolesnik, J. Surf. Invest.: X‑Ray Synchrotron Neutron Tech. 11, 1265 (2017).

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Stopping Power of Matter for a Beam of Monoenergetic Alpha Particles;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2023-02

2. Statistical Model of the Discrete Multiple Scattering of Charged Particles in a Substance Layer;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2022-08

3. Two-Stream Model of Monoenergetic Electron-Beam Backscattering: Application to Problems of the Diagnostics of Thin-Film Structures;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2020-11