1. Mishima, T., Taguchi, M., Sakata, H., and Maruyama, E., Sol. Energy Mater. Sol. Cells, 2011, vol. 95, no. 1, p. 18.
2. Schmidt, J. and Aberle, A.G., J. Appl. Phys., 1997, vol. 81, no. 9, p. 6186.
3. Kawata, Y., Kusaka, T., Hashizume, H., and Ojima, F., US Patent 5438276, 1995.
4. SEMI MF1535-0707: Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance, 2007.
5. Gaubas, E. and Kaniava, A., Rev. Sci. Instrum., 1996, vol. 67, no. 6, p. 2339.