Electric Noise in Field-Effect Transistors Based on ZnO:Li Films
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Published:2020-04
Issue:2
Volume:55
Page:157-163
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ISSN:1068-3372
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Container-title:Journal of Contemporary Physics (Armenian Academy of Sciences)
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language:en
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Short-container-title:J. Contemp. Phys.
Author:
Hovsepyan R. K.,Aghamalyan N. R.,Kafadaryan E. A.,Arakelyan A. A.,Mnatsakanyan G. G.,Petrosyan S. I.
Subject
General Physics and Astronomy
Reference20 articles.
1. Han, C., Xiang, D., Zheng, M., Lin, J., and Zhong, J., Nanotechnology, 2015, vol. 26, p. 095 202. 2. Wager, J.F., Keszler, D.A., and Presley, R.E., Transparent Electronics, Springer, 2008. 3. Abliz, A., Wei Huang, C., Wang, J., Xu, L., and Liao, L., ACS Appl. Mater. Interfaces, 2016, vol. 12, p. 7862. 4. Xiong, H.D., Wang, W., Li, Q., Richter, C., and Suehle, J.S., Appl. Phys. Let., 2007, vol. 91, p. 053107. 5. Buckingham, M.J., Noise in Electronic Devices and Systems, New York, John Wiley & Sons, 1983.
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