PRODUCT LIFE ASSESSMENT METHODOLOGY UNDER RADIATION EXPOSURE-Reference-Cited by-同舟云学术

PRODUCT LIFE ASSESSMENT METHODOLOGY UNDER RADIATION EXPOSURE

Published:2021-12-10 Issue: Volume: Page:
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Container-title:Materials of the All-Russian Scientific and Practical Conference "Modern aspects of modeling systems and processes"
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Author:

Zolnikov Konstantin¹,Evdokimova Svetlana²,Yagodkin A.²,Grechanyy Sergey²,Parmon P.³

Affiliation:

1. AO "Nauchno-issledovatel'skiy institut elektronnoy tehniki"

2. Voronezh State University of Forestry and Technologies named after G.F. Morozov

3. Scientific research institute electronic engineering

Abstract

The article proposes a method for calculating and experimental evaluation of the service life of products in the specified radiation conditions of outer space. The described method of estimating the resource of products takes into account the additive nature of ionization and structural effects in the specified radiation conditions of outer space. This method includes experimental and computa-tional stages.

Publisher

FSBE Institution of Higher Education Voronezh State University of Forestry and Technologies named after G.F. Morozov

Reference15 articles.

1. MIL-STD-883J. Method 1019.9. Ionizing Radiation (Total Dose) Test Pro-cedure. – 2013., MIL-STD-883J. Method 1019.9. Ionizing Radiation (Total Dose) Test Pro-cedure. – 2013.

2. ESCC Basic Specification No. 22900. Total Dose Steady-State Irradiation Test Method. – 2010., ESCC Basic Specification No. 22900. Total Dose Steady-State Irradiation Test Method. – 2010.

3. Petrov, A. Radiation testing of optocouplers intended for space application using the consecutive modelling of ionizing and displacement damage effects / A. Pe-trov, K. Tapero, G. Mosina // ISROS 2016 Proceedings, Otwock, Poland, 6–9 June 2016., Petrov, A. Radiation testing of optocouplers intended for space application using the consecutive modelling of ionizing and displacement damage effects / A. Pe-trov, K. Tapero, G. Mosina // ISROS 2016 Proceedings, Otwock, Poland, 6–9 June 2016.

4. Таперо, К. И. Определение срока службы оптронов в условиях космического пространства с использованием последовательного моделирования ионизационных эффектов и эффектов структурных повреждений / К. И. Таперо, А. С. Петров, Г. М. Мосина // Вопросы атомной науки и техники. Сер.: Физика радиационного воздействия на радиоэлектронную аппаратуру. – 2016. – Вып. 3. – С. 23–29., Tapero, K. I. Opredelenie sroka sluzhby optronov v usloviyah kosmicheskogo prostranstva s ispol'zovaniem posledovatel'nogo modelirovaniya ionizacionnyh effektov i effektov strukturnyh povrezhdeniy / K. I. Tapero, A. S. Petrov, G. M. Mosina // Voprosy atomnoy nauki i tehniki. Ser.: Fizika radiacionnogo vozdeystviya na radioelektronnuyu apparaturu. – 2016. – Vyp. 3. – S. 23–29.

5. Проектирование интерфейсов сбоеустойчивых микросхем / В.К. Зольников, Н.В. Мозговой, С.В. Гречаный, И.Н. Селютин, И.И. Струков // Моделирование систем и процессов. – 2020. – Т. 13, № 1. – С. 17-24., Proektirovanie interfeysov sboeustoychivyh mikroshem / V.K. Zol'nikov, N.V. Mozgovoy, S.V. Grechanyy, I.N. Selyutin, I.I. Strukov // Modelirovanie sistem i processov. – 2020. – T. 13, № 1. – S. 17-24.

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