Transmission Electron Microscopy Specimen Preparation of Delicate Materials Using Tripod Polisher
Author:
Affiliation:
1. School of Advanced Materials Science & Engineering, Sungkyunkwan University, Suwon 16419, Korea
2. School of Nano and Advanced Materials Engineering, Changwon National University, Changwon 51140, Korea
Funder
National Research Foundation of Korea(NRF)
Ministry of Science, ICT and Future Planning(MSIP)
Publisher
Korean Society of Electron Microscopy
Link
http://ocean.kisti.re.kr/downfile/crosscheck/ksem/JAKO201621650895146.pdf
Reference4 articles.
1. Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing
2. Reducing focused ion beam damage to transmission electron microscopy samples
3. Influence of TEM specimen preparation on chemical composition of Pb(Mg1/3Nb2/3)O3–PbTiO3 single crystals
4. Imaging individual atoms inside crystals with ADF-STEM
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