Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing-Reference-Cited by-同舟云学术

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Preparation of metallized GaN/sapphire cross sections for TEM analysis using wedge polishing

Published:2002 Issue:5 Volume:33 Page:489-492
ISSN:0968-4328
Container-title:Micron
language:en
Short-container-title:Micron

Author:

Chen J.,Ivey D.G.

Publisher

Elsevier BV

Subject

Cell Biology,Structural Biology,General Physics and Astronomy,General Materials Science

Reference11 articles.

1. Applications Laboratory Report 34, South Bay Technology Inc.

2. Benedict, J., Anderson, R., Klepeis, S.J., 1993. MSA Proceedings, 51st Annual Meeting, 708.

3. Recent Developments in the use of the Tripod Polisher for TEM Specimen Preparation

4. Comparison between TiAl and TiAlNiAu ohmic contacts to n-type GaN

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