A Comparison of Three Techniques Developed for Sampling and Analysis of Gunshot Residue by Scanning Electron Microscopy/Energy-Dispersive X-Ray Analysis (SEM-EDX)-Reference-Cited by-同舟云学术

A Comparison of Three Techniques Developed for Sampling and Analysis of Gunshot Residue by Scanning Electron Microscopy/Energy-Dispersive X-Ray Analysis (SEM-EDX)

Published:1992-01-01 Issue:1 Volume:37 Page:13234J
ISSN:0022-1198
Container-title:Journal of Forensic Sciences
language:en
Short-container-title:J. Forensic Sci.

Author:

DeGaetano Douglas¹,Siegel Jay A.²,Klomparens Karen L.³

Affiliation:

1. Coordinator, Forensic Science Division, Scientific Laboratories, Inc., Richmond, VA, US.

2. Associate professor, School of Criminal Justice, Michigan State University, 560 Baker Hall ast Lansing, MI 48824, US.

3. Associate professor, Center for Electron Optics, Michigan State University, East Lansing, MI, US.

Publisher

ASTM International

Subject

Genetics,Pathology and Forensic Medicine

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