High Spatial Resolution EDS Mapping of Nanoparticles at Low Accelerating Voltage-Reference-Cited by-同舟云学术

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High Spatial Resolution EDS Mapping of Nanoparticles at Low Accelerating Voltage

Published:2015-11-10 Issue:6 Volume:44 Page:20140457
ISSN:0090-3973
Container-title:Journal of Testing and Evaluation
language:en
Short-container-title:J. Test. Eval.

Author:

Liu Z. W.¹,Sun C.¹,Gauvin R.²,Wu W.¹,Zeng Y.³,Demers H.²

Affiliation:

1. Shanghai Institute of Ceramics, Chinese Academy of Science, Shanghai 200050, CN.

2. Dept. of Mining and Materials Engineering, McGill Univ., Montreal, CA.

3. Shanghai Institute of Ceramics, Chinese Academy of Science, Shanghai 200050, CN (Corresponding author), e-mail: zengyi@mail.sic.ac.cn

Publisher

ASTM International

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

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