Improving the Resolution of Kendrick Mass Defect Analysis for Polymer Ions with Fractional Base Units-Reference-Cited by-同舟云学术

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Improving the Resolution of Kendrick Mass Defect Analysis for Polymer Ions with Fractional Base Units

Published:2017 Issue:1 Volume:6 Page:A0055-A0055
ISSN:2186-5116
Container-title:Mass Spectrometry
language:en
Short-container-title:Mass Spectrometry

Author:

Fouquet Thierry¹,Sato Hiroaki¹

Affiliation:

1. National Institute of Advanced Industrial Science and Technology (AIST)

Publisher

The Mass Spectrometry Society of Japan

Subject

Spectroscopy,Instrumentation,Atomic and Molecular Physics, and Optics

Link

https://www.jstage.jst.go.jp/article/massspectrometry/6/1/6_A0055/_pdf

Reference30 articles.

1. 1) G. Montaudo, R. P. Lattimer. Mass Spectrometry of Polymers, CRC Press, Taylor and Francis group, Oxford, 2001.

2. 2) C. Wesdemiotis. Multidimensional mass spectrometry of synthetic polymers and advanced materials. Angew. Chem. Int. Ed. 56: 1452–1464, 2017.

3. 3) L. Charles. Influence of internal standard charge state on the accuracy of mass measurements in orthogonal acceleration time-of-flight mass spectrometers. Rapid Commun. Mass Spectrom. 22: 151–155, 2008.

4. 4) T. Satoh, H. Tsuno, M. Iwanaga, Y. Kammei. The design and characteristics features of a new time-of-flight mass spectrometer with a spiral ion trajectory. J. Am. Soc. Mass Spectrom. 16: 1969–1975, 2005.

5. 5) M. C. Bridoux, X. Machuron-Mandard. Capabilities and limitations of direct analysis in real time orbitrap mass spectrometry and tandem mass spectrometry for the analysis of synthetic and natural polymers. Rapid Commun. Mass Spectrom. 27: 2057–2070, 2013.

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