Author:
Leela Rani V.,Madhavi Latha M.
Abstract
Abstract
Leakage power is the dominant source of power dissipation in nanometer technology. As per the International Technology Roadmap for Semiconductors (ITRS) static power dominates dynamic power with the advancement in technology. One of the well-known techniques used for leakage reduction is Input Vector Control (IVC). Due to stacking effect in IVC, it gives less leakage for the Minimum Leakage Vector (MLV) applied at inputs of test circuit. This paper introduces Particle Swarm Optimization (PSO) algorithm to the field of VLSI to find minimum leakage vector. Another optimization algorithm called Genetic algorithm (GA) is also implemented to search MLV and compared with PSO in terms of number of iterations. The proposed approach is validated by simulating few test circuits. Both GA and PSO algorithms are implemented in Verilog HDL and the simulations are carried out using Xilinx 9.2i. From the simulation results it is found that PSO based approach is best in finding MLV compared to Genetic based implementation as PSO technique uses less runtime compared to GA. To the best of the author’s knowledge PSO algorithm is used in IVC technique to optimize power for the first time and it is quite successful in searching MLV.
Reference1 articles.
1. You sheng Leakage current optimizations during test based on don t care bits assignments of computer science and technology pp Sep;Wei wang;Journal,2007
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献