1. K. N. Tu and J. W. Mayer, in: Thin Films Interdiffusion and Interactions (Eds. J. M. Poate, K. N. Tu, J. W. Mayer), Wiley, New York 1978.
2. U. Gottlieb, F. Nava, M. Affronte, O. Laborde, and R. Madar, in: Properties of Metal Disilicides (Eds. K. Maex, M. van Rossum), EMIS Data Review Series No. 14, INSPEC, the Institution of Electrical Engineers, London 1995, p. 189.
3. P. A. Badoz, E. Rosencher, and J. Torres, J. Appl. Phys. 62, 890 (1987).
4. X. L. Liu, Y. Ren, H. Xu, and Z. W. Zhao, J. Cent. South Univ. Technol. 17, 888 (2010).
5. G. L. Xu, D. L. Zhang, Y. Z. Xia, X. F. Liu, Y. F. Liu, et al., Chin. Phys. Lett. 26, 046302 (2009).