1. F.Yang, L.Zhang, Z.Liu. S.Zhong, J.Ma, L.Bao, Advances in Materials Science and Engineering, (2016) article ID 9265195
2. Y. Goch, A.Haseb, M.Sabri, Electrochimica Acta, 90 (2013) 26510.1016/j.electacta.2012.12.036
3. M.H. Roh, J.P.Jung, W.Kim, Microelectronic Reliability 54 (2014) 26510.1016/j.microrel.2013.09.016
4. M. Kitajima, T.Shono, Microelectronic Reliability, 45 (2005) 120810.1016/j.microrel.2004.10.011
5. X. Chen, F. Xue, J. Zhou, Y.Yao, Journal of Alloys and Compounds, 633 (2015) 37710.1016/j.jallcom.2015.01.219