RkRk material measure

Author:

Seewig Jörg1,Eifler Matthias1,Hüser Dorothee2,Meeß Rudolf2

Affiliation:

1. Institute for Measurement and Sensor-Technology , Technische Universität Kaiserslautern , Kaiserslautern , Germany

2. 39428 Physikalisch-Technische Bundesanstalt (PTB) , Braunschweig , Germany

Abstract

Abstract The standard ISO 13565-2 defines the R k Rk parameters for the functional characterisation of technical surfaces. So far, no particular material measures for the calibration of these parameters have been defined in the international standardization. For the application and the functional behaviour of technical surfaces the R k Rk parameters however have a critical significance, so there is a demand by the industry to calibrate these parameters as they are increasingly applied for the quality assessment of workpieces. In the present paper, a proposal for suitable material measures is presented. An algorithm is described, which transforms the data of a real measured profile in a way that the exact defined parameters of R k Rk , R p k Rpk and R v k Rvk are equated. The material measures geometry corresponds to its later application and the target parameters are almost freely selectable. The approach for transforming surface profile data with the aid of the Abbott curve is introduced generically, solves an inverse problem and considers the influences from the manufacturing and measuring process. The designed material measure is manufactured with the aid of ultra-precision turning. In matters of the aspired industrial application, comparison measurements are carried out in order to examine the practical abilities of the material measure and the repeatability of the approach is proven.

Funder

Deutsche Forschungsgemeinschaft

Publisher

Walter de Gruyter GmbH

Subject

Electrical and Electronic Engineering,Instrumentation

Reference26 articles.

1. Geometrical Product Specifications (GPS) – Surface texture: Profile method; Surfaces having stratified functional properties – Part 2: Height characterization using the linear material ratio curve (ISO 13565-2:1996).

2. Geometrical Product Specifications (GPS) – Surface texture: Profile method – Terms, definitions and surface texture parameters (ISO 4287:1997 + Cor 1:1998 + Cor 2:2005 + Amd 1:2009).

3. Wiehr, C.; Seewig, J. 2011 3D-Kenngrößen nach ISO 25178. In: Alexander Wanner (Ed.): Fortschritte in der Metallographie, Vortragstexte der 45. Metallographie-Tagung, 14.-16. September 2011, Karlsruhe. Frankfurt, MAT-INFO, Werkstoff-Informationsges, 3–8.

4. Geometrical Product Specifications (GPS) – Surface texture: Profile method; Surfaces having stratified functional properties – Part 1: Filtering and general measurement conditions (ISO 13565-1: 1996).

5. Geometrical Product Specifications (GPS) – Surface texture: Profile method; Surfaces having stratified functional properties – Part 3: Height characterization using the material probability curve (ISO 13565-3:1998).

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3