The effect of the withdrawal speed on properties of nickel oxide thin films-Reference-Cited by-同舟云学术

The effect of the withdrawal speed on properties of nickel oxide thin films

Published:2019-07-19 Issue:10 Volume:234 Page:647-655
ISSN:2196-7105
Container-title:Zeitschrift für Kristallographie - Crystalline Materials
language:en
Short-container-title:

Author:

Kayani Zohra Nazir¹,Aslam Atiqa²,Ishaque Rabia²,Zahra Syeda Nosheen²,Hanif Hifza²,Maken Noor-Ul-Ain²,Khan Hajra²

Affiliation:

1. Lahore College for Women University , Lahore 54000 , Pakistan , Tel.: 0092-42-99203801-9 (248), Fax: 0092-42-99203877

2. Lahore College for Women University , Lahore , Pakistan

Abstract

Abstract Nickel oxide thin films have been prepared by sol-gel dip-coating technique on glass substrate. It is shown that nickel oxide thin films have poly crystalline nature. Nickel oxide thin films exhibit high transmission (39–85%) in the wavelength range of 400–900 nm, strong absorption between 300 and 400 nm wavelengths and decrease of band gap values are in the range 3.69–3.27 eV with increase of withdrawal speed. High band gap at low withdrawal speed is because of the small average crystallite size, which decreases with increase in withdrawal speed. The SEM micrograph shows cubic crystallites and surface of thin films become dense, smooth and homogeneous with an increase in withdrawal speed. Assessment of nickel oxide deposition conditions provides gateway for effective and cheap solar cells.

Publisher

Walter de Gruyter GmbH

Subject

Inorganic Chemistry,Condensed Matter Physics,General Materials Science

Link

https://www.degruyter.com/document/doi/10.1515/zkri-2019-0028/pdf

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