Affiliation:
1. Institut für Angewandte Physik der Technischen Hochschule Karlsruhe
Abstract
The tunneling current through Al2O3-layers of a thickness varying between 30 and 100 Å was measured for In-Al2O3-Al, Al-Al2O3-Al, and Au-Al2O3-Al layer cells. The dependence of the observed current on the applied voltage, the thickness of the Al2O03-layer, and temperature is in agreement with an analysis of tunneling currents through insulating films by STRATTON. By comparing the experimental data with the analytical expressions the following values are derived for the metal-Al2O3 work function: In: 0.55 eV; Al: 0.77 eV; Au: 1.6 eV.
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy,Mathematical Physics
Cited by
10 articles.
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