Tunneling Spectroscopy of Organic Monolayers and Single Molecules
Author:
Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/128_2011_175
Reference122 articles.
1. Hipps KW, Keder JK (1983) A direct comparison of surface Raman spectroscopy and inelastic electron tunneling spectroscopy. J Phys Chem 87:3187–3189
2. Hipps KW, Dowdy J, Hoagland JJ (1991) Surface Raman spectra of a biased and buried ultra-thin CuPc layer. Langmuir 7:5–7
3. Tsang JC, Yokota Y, Matz R, Rubloff G (1984) Raman spectroscopy of PtSi formation at the Pt/Si(100) interface. Appl Phys Lett 44:430–432
4. Heske C, Eich D, Fink R, Umbach E, van Buuren T, Bostedt C, Terminello LJ, Kakar S, Grush MM, Callcott TA, Himpsel FJ, Ederer DL, Perera RCC, Riedl W, Karg F (1999) Observation of intermixing at the buried Cds/Cu(In, Ga)Se2 thin film solar cell heterojunction. Appl Phys Lett 74:1451–1453
5. Jarrige I, Jonnard P, Frantz-Rodriguez N, Danaie K, Bosseboeuf A (2002) Study of the NiTi/SiO2 interface: analysis of the electronic distributions. Surf Interface Anal 34:694–697
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. The Luminescence Hypothesis of Olfaction;Sensors;2023-01-25
2. Single-molecule electronics: Cooling individual vibrational modes by the tunneling current;The Journal of Chemical Physics;2016-03-21
3. Semiquantitative Submolecular Barrier Height Measurements of 4-Aza-8-fluorotryptanthrin Monolayers on HOPG: Orbital-Mediated Tunneling;The Journal of Physical Chemistry C;2016-02-04
4. Unimolecular Electronics;Chemical Reviews;2015-05-07
5. In-SituScanning Probe Microscopies: Imaging and Beyond;Developments in Electrochemistry;2014-06-24
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3