Application of the linear sampling method to identify cracks with impedance boundary conditions
Author:
Affiliation:
1. ENIT-LAMSIN, Université de Tunis el-Manar, BP 37, 1002 Tunis, Tunisia
2. INRIA Saclay Ile de France/CMAP Ecole Polytechnique, Route de Saclay, 91128 Palaiseau Cedex, France
Publisher
Informa UK Limited
Subject
Applied Mathematics,Computer Science Applications,General Engineering
Link
https://www.tandfonline.com/doi/pdf/10.1080/17415977.2012.686997
Reference14 articles.
1. The linear sampling method for cracks
2. Delbary, F, Identifications de fissures par des ondes acoustiques, Ph.D. diss. Université de Paris 6, 2006.
3. A linear sampling method for inverse scattering from an open arc
4. The Identification of Thin Dielectric Objects from Far Field or Near Field Scattering Data
5. Identification of surface impedance of thin dielectric objects from far-field data
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