The Identification of Thin Dielectric Objects from Far Field or Near Field Scattering Data
Author:
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Subject
Applied Mathematics
Link
http://epubs.siam.org/doi/pdf/10.1137/070711542
Reference22 articles.
1. Scattering of Electromagnetic Waves by Thin Dielectric Planar Structures
2. ON THE USE OF THE RECIPROCITY-GAP FUNCTIONAL IN INVERSE SCATTERING FROM PLANAR CRACKS
3. Thin-skin eddy-current inversion for the determination of crack shapes
4. Crack detection using electrostatic measurements
5. Combined far-ield operators in electromagnetic inverse scattering theory
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