Novel temperature calibration for epitaxial growth characterization-Reference-Cited by-同舟云学术

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Novel temperature calibration for epitaxial growth characterization

Published:2015-08-21 Issue:2 Volume:44 Page:127-138
ISSN:1073-9149
Container-title:Instrumentation Science & Technology
language:en
Short-container-title:Instrumentation Science & Technology

Author:

Yan Dong,Lee Shing Man,Wang Linzi,Liu Jianpeng

Funder

the National Science and Technology Major Project of the Ministry of Science and Technology of China

Publisher

Informa UK Limited

Subject

General Environmental Science,Instrumentation,General Chemical Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/10739149.2015.1081934

Reference21 articles.

1. Nitride-based semiconductors for blue and green light-emitting devices

2. Fabrication of GaN/InGaN MQW blue light emitting diode

3. InGaN-GaN multiquantum-well blue and green light-emitting diodes

4. InGaN-based epilayers and quantum wells with intense room-temperature photoluminescence in the 500–650nm range

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Measurement of Ti–6Al–4V alloy ignition temperature by reflectivity detection;Review of Scientific Instruments;2018-04

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