LEAD-BASED FERROELECTRIC COMPOUNDS: INSULATORS OR SEMICONDUCTORS?
Author:
Affiliation:
1. a Max Planck Institute for Microstructure Physics , Weinberg, Halle, 2, 06120, Germany
2. b National Institute of Materials Physics, Bucharest-Magurele, P.O. Box MG-7 , 077125, Romania
Publisher
Informa UK Limited
Subject
Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/10584580500413434
Reference20 articles.
1. Origin of ferroelectricity in perovskite oxides
2. Device modeling of ferroelectric capacitors
3. Coercive field of ultrathin Pb(Zr0.52Ti0.48)O3 epitaxial films
4. The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor deposition
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1. Large polarization gradients and temperature-stable responses in compositionally-graded ferroelectrics;Nature Communications;2017-05-10
2. Polarization coupling transition inBaTiO3/PbZr0.2Ti0.8O3ferroelectric bilayers;Physical Review B;2016-01-29
3. Oxygen sensitivity of SrTiO3 thin film prepared using atomic layer deposition;Sensors and Actuators B: Chemical;2009-03
4. Stability of photovoltage and trap of light-induced charges in ferroelectric WO3-doped (Pb0.97La0.03)(Zr0.52Ti0.48)O3 thin films;Applied Physics Letters;2007-08-27
5. The effect of wavelength on the deposition of Ag onto PZT thin films during UV irradiation;2007 Sixteenth IEEE International Symposium on the Applications of Ferroelectrics;2007-05
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