Local Dielectric and Polarization Properties of Inner and Outer Interfaces in PZT Thin Films-Reference-Cited by-同舟云学术

Local Dielectric and Polarization Properties of Inner and Outer Interfaces in PZT Thin Films

Published:2004-01 Issue:1 Volume:62 Page:13-21
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

ENG L. M.¹,GRAFSTRÖM S.¹,LOPPACHER C.¹,LU X. M.²,SCHLAPHOF F.¹,FRANKE K.³,SUCHANECK G.⁴,GERLACH G.⁴

Affiliation:

1. a Institute of Applied Photophysics, TU Dresden , Dresden, Germany , D-01062

2. b Physics Department, Nanjing University , Nanjing, 210008

3. c Institut für Festkörper- und Werkstoffforschung Dresden e.V.

4. d Institute of Solid State Electronics , Dresden

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580490460277

Reference37 articles.

1. Ferroelectric Memories

2. Domain structure of epitaxial SrRuO3 thin films on miscut (001) SrTiO3 substrates

3. Growth and characterization of non-c-oriented epitaxial ferroelectric SrBi2Ta2O9 films on buffered Si(100)

4. Nanoscale domain engineering and characterization of ferroelectric domains

5. Nondestructive imaging and characterization of ferroelectric domains in periodically poled crystals

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