Life cycle testing of BaxSr1−xTiO3 ferroelectric thin films in a tlinable microwave device-Reference-Cited by-同舟云学术

Life cycle testing of BaxSr1−xTiO3 ferroelectric thin films in a tlinable microwave device

Published:2001-02 Issue:1-4 Volume:34 Page:247-254
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Miranda Felix A.¹,Van Keuls Fred W.¹,Romanofsky Robert R.¹,Mueller Carl H.¹,Warner Joseph D.¹

Affiliation:

1. a NASA Glenn Research Center , Cleveland, OH, 44135

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580108012894

Reference6 articles.

1. Thin film multilayer conductor/ferroelectric tunable microwave components for communication applications

2. (YBa2Cu3O7−δ,Au)/SrTiO3/LaAlO3 thin film conductor/ferroelectric coupled microstripline phase shifters for phased array applications

3. A cryogenic GaAs PHEMT/ferroelectric Ku-band tunable oscillator

4. Structure/property relationships in ferroelectric thin films for frequency agile microwave electronics

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1. Reliability study of tunable ferroelectric capacitors;Journal of Applied Physics;2008-09-15

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3. Investigation of electrical degradation effects in ferroelectric thin film based tunable microwave components;INTEGR FERROELECTR;2002