Structure/property relationships in ferroelectric thin films for frequency agile microwave electronics-Reference-Cited by-同舟云学术

Structure/property relationships in ferroelectric thin films for frequency agile microwave electronics

Published:1998-03 Issue:1-4 Volume:22 Page:279-289
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Horwitz J. S.¹,Chang W.¹,Carter A. C.¹,Pond J. M.¹,Kirchoefer S. W.¹,Chrisey D. B.¹,Levy J.²,Hubert C.²

Affiliation:

1. a Naval Research Laboratory , Washington , D.C. , 20375 , USA

2. b University of Pittsburgh , Pittsburgh , PA , 15260 , USA

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584589808208049

Reference10 articles.

1. SrxBa(1−x)TiO3 thin films for active microwave device applications

2. Preparation and properties of (Ba, Sr)TiO3 single crystals

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