STRONG DEGRADATION OF PHYSICAL PROPERTIES AND FORMATION OF A DEAD LAYER IN FERROELECTRIC FILMS DUE TO INTERFACIAL DISLOCATIONS-Reference-Cited by-同舟云学术

STRONG DEGRADATION OF PHYSICAL PROPERTIES AND FORMATION OF A DEAD LAYER IN FERROELECTRIC FILMS DUE TO INTERFACIAL DISLOCATIONS

Published:2005-07 Issue:1 Volume:71 Page:67-80
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

MISIRLIOGLU I. B.¹,VASILIEV A. L.¹,AINDOW M.¹,ALPAY S. P.¹

Affiliation:

1. a Department of Metallurgy and Materials Engineering and Institute of Materials Science, University of Connecticut , Storrs, CT, 06269

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580590964709

Reference35 articles.

1. Defects in epitaxial multilayers

2. Strain relaxation and defect formation in heteroepitaxial Si1−xGex films via surface roughening induced by controlled annealing experiments

3. Misfit dislocation propagation kinetics in GexSi1−x/Ge(100) heterostructures

4. Strain relaxation kinetics in Si1−xGex/Si heterostructures

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Dislocation Density‐Mediated Functionality in Single‐Crystal BaTiO₃;Advanced Science;2024-06-17

2. Effect of temperature on dislocation-tuned dielectricity and piezoelectricity in single-crystal BaTiO3;Applied Physics Letters;2024-03-11

3. Fatigue-free dielectric and piezoelectric response in single-crystal BaTiO3 tuned by dislocation imprint;Applied Physics Letters;2023-03-13

4. Effects of Phase and Local Structures on the Electronic and Optical Properties of K0.5na0.5nbo3 Solid Solutions;SSRN Electronic Journal;2022

5. Epitaxial ferroelectric interfacial devices;Applied Physics Reviews;2021-12