Ultralow-frequency dielectric relaxation and fatigue properties of PZT thin film-Reference-Cited by-同舟云学术

Ultralow-frequency dielectric relaxation and fatigue properties of PZT thin film

Published:2001-01 Issue:1-4 Volume:37 Page:225-234
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Lee Su Jae¹,Moon Seung Eon²,Kim Won Jeong²,Kim Eun Kyoung²

Affiliation:

1. b E-mail:

2. a Electronics and Telecommunications Research Institute , 161 Kajong, Yusong, Taejon, 305-350, Korea

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580108015681

Reference11 articles.

1. Ceramic Thin Films: Fabrication and Applications

2. Low-frequency dielectric relaxation of BaTiO3 thin-film capacitors

3. Current-Voltage Characteristics of Electron-Cyclotron-Resonance Sputter-DepositedSrTiO3Thin Films

4. Electrode effects on the low-frequency dielectric properties of (Ba, Sr)TiO3 thin films prepared by pulsed laser ablation

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