Reduced dielectric dispersion in ferroelectric (Pb,La)TiO3/(Pb,Ca)TiO3 thin-film multilayer heterostructures due to a mechanical stress relaxation mechanism-Reference-Cited by-同舟云学术

Reduced dielectric dispersion in ferroelectric (Pb,La)TiO3/(Pb,Ca)TiO3 thin-film multilayer heterostructures due to a mechanical stress relaxation mechanism

Published:2004-05-24 Issue:21 Volume:84 Page:4161-4163
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Poyato Rosalı́a,Calzada M. Lourdes,Pardo Lorena

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1755422

Reference23 articles.

1. Dielectric Properties of Multilayered Ferroelectric Thin Films Fabricated by Sol-Gel Method

2. Stacking effects on dielectric properties of sol-gel derived Pb(Zr0.53Ti0.47)O3/PbTiO3 thin films

3. Poling of multilayer Pb(Zr0.3Ti0.7)O3/PbTiO3 thin film for pyroelectric infrared sensor application

4. Compositional and structural study of ferroelectric multilayer (Pb,La)TiO3/(Pb,Ca)TiO3 sol–gel thin films

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