ELECTRICAL CHARACTERIZATION AND RELIABILITY OF LANTHANUM DOPED PZT THIN FILMS CAPACITORS-Reference-Cited by-同舟云学术

ELECTRICAL CHARACTERIZATION AND RELIABILITY OF LANTHANUM DOPED PZT THIN FILMS CAPACITORS

Published:2008-06-10 Issue:1 Volume:96 Page:75-81
ISSN:1058-4587
Container-title:Integrated Ferroelectrics
language:en
Short-container-title:Integrated Ferroelectrics

Author:

Chentir M. T.¹²,Bouyssou E.²,Ventura L.¹,Guégan G.²,Anceau C.²

Affiliation:

1. a François Rabelais University, Tours: Laboratoire de Microélectronique de Puissance

2. b STMicroelectronics, 16, Rue P. & M. Curie BP 7155 , 37071 , Tours Cedex 2

Publisher

Informa UK Limited

Subject

Materials Chemistry,Electrical and Electronic Engineering,Condensed Matter Physics,Ceramics and Composites,Control and Systems Engineering,Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/10584580802100960

Reference8 articles.

1. dc Electrical Degradation of Perovskite-Type Titanates: I, Ceramics

2. Resistance degradation in barium strontium titanate thin films

3. Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics

4. Wafer level reliability and leakage current modeling of PZT capacitors

5. Electrical conductivity in ferroelectric thin films

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Influence of graded doping on the long-term reliability of Nb-doped lead zirconate titanate films;Acta Materialia;2021-10

2. Key Role of Oxygen-Vacancy Electromigration in the Memristive Response of Ferroelectric Devices;Physical Review Applied;2020-10-23

3. Influence of Film Texture on Reliability of Sol-Gel Derived PZT Thin-Film Capacitors;Key Engineering Materials;2013-07

4. Leakage Currents in PZT Capacitors;Ferroelectric Dielectrics Integrated on Silicon;2013-02-27

5. Tensile test of lead zirconate titanate (PZT)/Platinum (Pt) thin film;Materialwissenschaft und Werkstofftechnik;2011-05