Scatterometer performance with polarization discrimination ratio approach to retrieve crop soybean parameter at X‐band
Author:
Affiliation:
1. a Department of Electronics and Computer Engineering , Indian Institute of Technology , Roorkee, (UA)‐247667, India
Publisher
Informa UK Limited
Subject
General Earth and Planetary Sciences
Link
https://www.tandfonline.com/doi/pdf/10.1080/01431160600735988
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