Signal detection techniques for scattering-type scanning near-field optical microscopy-Reference-Cited by-同舟云学术

Signal detection techniques for scattering-type scanning near-field optical microscopy

Published:2018-03-06 Issue:10 Volume:53 Page:806-835
ISSN:0570-4928
Container-title:Applied Spectroscopy Reviews
language:en
Short-container-title:Applied Spectroscopy Reviews

Author:

Dai Guangbin¹²,Yang Zhongbo²,Geng Guoshuai¹²,Li Mingliang¹,Chang Tianying¹²,Wei Dongshan²,Du Chunlei²,Cui Hong-Liang¹²,Wang Huabin²³

Affiliation:

1. College of Instrumentation and Electrical Engineering, Jilin University, Changchun, Jilin, China

2. Chongqing Engineering Research Center of High-Resolution and Three-Dimensional Dynamic Imaging Technology, Chongqing Institute of Green and Intelligent Technology, Chinese Academy of Sciences, Chongqing, China

3. Key Laboratory of Interfacial Physics and Technology, Chinese Academy of Sciences, Shanghai, China

Funder

Chinese Ministry of Science & Technology

Chongqing Science and Technology Commission

Chinese Academy of Sciences for a Key Scientific Instrument and Equipment Development Project

Publisher

Informa UK Limited

Subject

Spectroscopy,Instrumentation

Link

https://www.tandfonline.com/doi/pdf/10.1080/05704928.2018.1443275

Reference98 articles.

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4. Optical near-field excitation at commercial scanning probe microscopy tips: a theoretical and experimental investigation

5. Terahertz Near-Field Nanoscopy of Mobile Carriers in Single Semiconductor Nanodevices

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