Novel method for the determination of the optical conductivity and dielectric constant of SiGe thin films using Kato-Adachi dispersion model
Author:
Affiliation:
1. Laboratory of Applied Physics, Sfax Faculty of Science, University of Sfax, Sfax, Tunisia
2. Physics Department, Science Faculty at Yanbu, Taibah University, Taibah, Saudi Arabia
3. Photonics Laboratory, Angers University, Angers, France
Publisher
Informa UK Limited
Subject
General Materials Science,Instrumentation
Link
https://www.tandfonline.com/doi/pdf/10.1080/01411594.2020.1832224
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