Contrast of crystal defects under polarized light

Author:

Tanner B. K.,Fathers D. J.

Publisher

Informa UK Limited

Cited by 49 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Polarized light observation of semiconductor wafers for power devices;2022 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK);2022-11-28

2. Observation of in-plane shear stress fields in off-axis SiC wafers by birefringence imaging;Journal of Applied Crystallography;2022-07-30

3. Design of automatic detection algorithm for dislocation contrasts in birefringence images of SiC wafers;Japanese Journal of Applied Physics;2021-02-03

4. Demonstration of Observation of Dislocations in GaN by Novel Birefringence Method;physica status solidi (b);2020-04

5. Determination of the dislocation structure in paratellurite single crystals using the piezo-optic effect;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2014-01

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