A note on the increase in usable foil thickness in scanning transmission electron microscopy-Reference-Cited by-同舟云学术

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A note on the increase in usable foil thickness in scanning transmission electron microscopy

Published:1975-01 Issue:1 Volume:31 Page:225-228
ISSN:0031-8086
Container-title:Philosophical Magazine
language:en
Short-container-title:Philosophical Magazine

Author:

Fraser Hamish L.,Jones Ian P.

Publisher

Informa UK Limited

Link

http://www.tandfonline.com/doi/pdf/10.1080/14786437508229298

Reference7 articles.

1. Booker, G. R. Proc. Fifth European Congress on Electron Microscopy. pp.470Manchester

2. Preservation of electron microscope image contrast after inelastic scattering

3. Hirsch, P. B. and Humphreys, C. J. Proc. Fourth European Regional Conference on Electron Microscopy. pp.49Rome

4. Maximizing the penetration in high voltage electron microscopy

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Transmission Electron Microscopy for Physical Metallurgists;Physical Metallurgy;2014

2. Stem Imaging of Crystals and Defects;Introduction to Analytical Electron Microscopy;1979

3. Low resolution STEM imaging;Proceedings, annual meeting, Electron Microscopy Society of America;1978

4. Metallurgical applications of scanning transmission electron microscopy;Journal of Materials Science;1977-05

5. Reply to “comments on energy dispersive x-ray measurements of thin metal foils”;Scripta Metallurgica;1977-04

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