Stem Imaging of Crystals and Defects-Reference-Cited by-同舟云学术

Stem Imaging of Crystals and Defects

Published:1979 Issue: Volume: Page:305-332
ISSN:
Container-title:Introduction to Analytical Electron Microscopy
language:
Short-container-title:

Author:

Humphreys C. J.

Publisher

Springer US

Link

http://link.springer.com/content/pdf/10.1007/978-1-4757-5581-7_11

Reference47 articles.

1. Anstis, G. R. and Cockayne, D. J. H., 1979, Acta Cryst., (in press).

2. Booker, G. R., Joy, D. C. Spencer, J. P., Harrach, H. Graf von, and Thompson M. N., 1974, Proc. Sevent Ann. Symp. on Scanning Microsc., ed. Om Johari, IIT Res. Inst., Chicago, p. 225.

3. Booker, G. R., Joy, D. C., Spencer, J. P. and Humphreys, C. J., 1973, Proc. 6th Ann. Symp. on Scanning Microsc., ed. Om Johari, IIT Research Institute, Chicago, p. 251.

4. Brown, L. M., 1977, in Developments in Electron Microscopy and Analysis, 1977, ed. D. L. Misell, The Inst. of Physics, Bristol and London, p. 141.

5. Brown, L. M. Craven, A. H., Jones, L. G. P., Griffith, A., Stobbs, W. M. and Wilson, C. J., 1976 in Scanning Electron Microscopy/1976, ed. Om Johari, IIT Research Institute, Chicago, p. 353.

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