The dose dependence of 45 keV V+and Bi+Ion sputtering yield of copper

Author:

Andersen Hans Henrik

Publisher

Informa UK Limited

Subject

General Engineering

Cited by 33 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Low erosion behavior of polystyrene films under erbium ion implantation;Applied Physics Letters;2006-02-13

2. High dose uranium ion implantation into silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1988-06

3. Range profiles of25–100-keV neon ions in eleven elemental solids;Physical Review B;1986-09-01

4. The Theory of the Preferential Sputtering of Alloys, Including the Role of Gibbsian Segregation;Erosion and Growth of Solids Stimulated by Atom and Ion Beams;1986

5. Energy dependence of the ion-induced sputtering yields of monatomic solids;Atomic Data and Nuclear Data Tables;1984-07

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