1. Davidson, M., Kaufman, K., Mazor, I. and Cohen, F. 1987.Integrated Circuit Metrology, Inspection and Process Control, Vol. 775, 233Bellingham, WA: SPIE. Proceedings of the SPIE
2. Mirau correlation microscope
3. Profilometry with a coherence scanning microscope
4. New spectral representation of random sources and of the partially coherent fields that they generate
5. Born, M. and Wolf, E. 1980.Principles of Optics, sixth edition, 321Oxford: Pergamon.