An algorithm for profilometry by white-light phase-shifting interferometry-Reference-Cited by-同舟云学术

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An algorithm for profilometry by white-light phase-shifting interferometry

Published:1996-08 Issue:8 Volume:43 Page:1545-1554
ISSN:0950-0340
Container-title:Journal of Modern Optics
language:en
Short-container-title:Journal of Modern Optics

Author:

Sandoz Patrick

Publisher

Informa UK Limited

Subject

Atomic and Molecular Physics, and Optics

Link

http://www.tandfonline.com/doi/pdf/10.1080/09500349608232826

Reference13 articles.

1. Born, M. and Wolf, E. 1980.Principles of Optics, sixth edition, 494–499. Oxford: Pergamon.

2. V Phase-Measurement Interferometry Techniques

3. Davidson, M., Kaufman, K., Mazor, I. and Cohen, F. 1987.Proceedings of SPIE, Vol. 775, 233Bellingham, Washington: SPIE. p.

4. Mirau correlation microscope

5. Interferometric profiler for rough surfaces

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1. Noncontact surface profiling using optical interferometric microscopy;Optical Engineering;2024-02-20

2. Polarizing white light interferometry for phase measurements using two simultaneous interferograms;Applied Optics;2023-09-15

3. Profilometry by zero-order interference fringe identification in the Commission Internationale de l’Eclairage system;Journal of Modern Optics;2023-04-16

4. Pseudo Wigner-Ville distribution for 3D white light scanning interferometric measurement;Optics Express;2022-10-18

5. Correction of PZT scanner errors using a phase compensation method in white-light phase-shifting interferometry;Applied Optics;2021-10-13

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