Analytical examination of the functional form of the experimental conduction characteristic for a formed MIM device showing VCNR
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00207218508939065
Reference11 articles.
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1. On the evaluation of statistical parameters of a normal distribution of filamentary resistances in a formed MIM device;Journal of Materials Science Letters;1985-12
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