HALVFEM—a computer program for two-dimensional finite element analysis of semiconductor devices
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00207218108901216
Reference15 articles.
1. Two-dimensional semiconductor analysis using finite-element method
2. Sparse Matrix Techniques
3. Finite-element methods in semiconductor device simulation
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Finite element analysis of SiGe heterojunction devices;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1995-07
2. A system of mixed device-circuit modeling for personal computers;Solid-State Electronics;1993-03
3. MOSFET analysis through numerical solution of Poisson's equation by the method of moments;Solid-State Electronics;1987-12
4. Process integration issues for a 0.25 μm n‐channel metal‐oxide‐semiconductor technology;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;1986-05
5. Experimental behaviour and two-dimensional simulations of MOS transistors in weak inversion region;International Journal of Electronics;1981-09
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