The effect of annealing on the AC electrical properties of SiO/SnO2amorphous thin films-Reference-Cited by-同舟云学术

The effect of annealing on the AC electrical properties of SiO/SnO2amorphous thin films

Published:1987-05 Issue:5 Volume:62 Page:685-690
ISSN:0020-7217
Container-title:International Journal of Electronics
language:en
Short-container-title:International Journal of Electronics

Author:

RAHMAN A. S. Md. S.,ISLAM M. H.,HOGARTH C. A.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/00207218708921021

Reference13 articles.

1. Structural, Optical, and Electrical Properties of Amorphous Silicon Films

2. Is there an intimate relation between amorphous and crystalline semiconductors?

3. Dielectric Properties and DC Conductivity of Vacuum-Deposited SiO Films

4. HOGARTH , C. A. , and WRIGHT , L. A. , 1968 , Some properties of mixed oxide layers having amorphous structures .Proceedings of the International Conference on the Physics of Semiconductors, Moscow , U.S.S.R. ( Nauka: Leningrad ) p. 1274 .

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