Dielectric behavior of Cu–GeO2 cermet thin films
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanical Engineering,Mechanics of Materials,General Materials Science
Link
http://link.springer.com/article/10.1007/s10853-006-1001-z/fulltext.html
Reference18 articles.
1. Lucy IB (2004) J Mat Sci 39:3163
2. Zaidi SZA, Beynon J, Steele CB (1997) J Mat Sci 32(15):3921
3. Hosseini AA, Hogarth CA, Beynon J (1994) J Mat Sci Lett 13:1144
4. Steele CB, Beynon J, Hogarth CA, (1992) Thin Solid Films 213:76
5. Lucy IB, (1999) Ind J Pure Appl Phy 37:836
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1. Atomic layer deposition of SiO2–GeO2 multilayers;Applied Physics Letters;2020-07-27
2. Optical, electrical properties and reproducible resistance switching of GeO2 thin films by sol–gel process;Thin Solid Films;2011-05
3. Microstructural, optical and electrical properties of GeO2 thin films prepared by sol-gel method;Crystal Research and Technology;2010-11-05
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