Further studies on thin film structures of metal-borosilicate glass-metal-Reference-Cited by-同舟云学术

Further studies on thin film structures of metal-borosilicate glass-metal

Published:1974-08 Issue:2 Volume:37 Page:145-156
ISSN:0020-7217
Container-title:International Journal of Electronics
language:en
Short-container-title:International Journal of Electronics

Author:

HOGARTH C. A.,TAHERI E. H. Z.

Publisher

Informa UK Limited

Subject

Electrical and Electronic Engineering

Link

http://www.tandfonline.com/doi/pdf/10.1080/00207217408900509

Reference19 articles.

1. Some electrical properties of thin film copper–borosilicate glass–copper sandwiches intended for use as electron emitters

2. A model for filament growth and switching in amorphous oxide films

3. GREEN , P. D. , BUSH , E. L. , and RAWLINGS , I. R. , 1969 , Proceedings of the Symposium on Deposited Thin Film Dielectric Materials ( Electrochemical Society ) .

4. Hot electron attenuation in silicon oxide

5. Low‐Frequency Negative Resistance in Thin Anodic Oxide Films

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