An effective logic BIST scheme based on LFSR-reseeding and TVAC
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00207217.2013.828189
Reference7 articles.
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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4. A comparative analysis of LFSR cascading for hardware efficiency and high fault coverage in BIST applications;2020 IEEE 29th Asian Test Symposium (ATS);2020-11-23
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