Effect of annealing temperature on the electrical characteristics of Platinum/4H-SiC Schottky barrier diodes
Author:
Publisher
Informa UK Limited
Subject
Electrical and Electronic Engineering
Link
http://www.tandfonline.com/doi/pdf/10.1080/00207217.2011.609963
Reference23 articles.
1. Schottky-barrier behavior of metals onn- andp-type6H−SiC
2. Ayalew, T. (2004), ‘SiC Semiconductor Devices Technology, Modelling and Simulation’, PhD Dissertation, Technical University Wien
3. Extraction of Schottky diode parameters from forward current‐voltage characteristics
4. SiC and GaN bipolar power devices
5. Barrier inhomogeneities and electrical characteristics of Ti/4H-SiC Schottky rectifiers
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