De-correlation Effects in Speckle-pattern Interferometry
Author:
Affiliation:
1. a Department of Mechanical Engineering, University of Technology, Loughborough, Leicestershire, England
Publisher
Informa UK Limited
Subject
Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/716099421
Reference9 articles.
1. De-correlation Effects in Speckle-pattern Interferometry. 1. Wavelength change dependent de-correlation with application to contouring and surface roughness measurement
2. Recording of In-plane Surface Displacement by Double-exposure Speckle Photography
3. A white light projection technique for viewing double-exposure speckle interferograms
4. Holographic and Video Techniques Applied to Engineering Measurement
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