De-correlation Effects in Speckle-pattern Interferometry. 1. Wavelength change dependent de-correlation with application to contouring and surface roughness measurement-Reference-Cited by-同舟云学术

De-correlation Effects in Speckle-pattern Interferometry. 1. Wavelength change dependent de-correlation with application to contouring and surface roughness measurement

Published:1977-05 Issue:5 Volume:24 Page:517-532
ISSN:0030-3909
Container-title:Optica Acta: International Journal of Optics
language:en
Short-container-title:Optica Acta: International Journal of Optics

Author:

Wykes C.¹

Affiliation:

1. a Department of Mechanical Engineering, University of Technology, Loughborough, Leicestershire, England

Publisher

Informa UK Limited

Subject

Electronic, Optical and Magnetic Materials

Link

https://www.tandfonline.com/doi/pdf/10.1080/716099422

Reference9 articles.

1. Laser Speckle and Related Phenomena

2. Some observations on the direct comparison of the geometry of two objects using speckle pattern interferometric contouring

3. GOODMAN , J. W. 1963. Stanford Electronics Laboratories. TR2303-1, (SEL-63-140)

4. BUTTERS , J. N. and LEENDERTZ , J. A. Proc. Technical Program Electro Optics Conference. pp.43Brighton: Kiver Communications.

5. A study of fringe clarity in laser interferometry and holography

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