Subject
Electrical and Electronic Engineering
Cited by
18 articles.
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1. Mechanical stresses on the SiSiO2 interface;Physica Status Solidi (a);1987-01-16
2. Improved SERMOSFET process;Solid-State Electronics;1980-09
3. Mosfets with low threshold value;Microelectronics Reliability;1980-01
4. Sputter-delineated MOST process;Proceedings of the IEEE;1980
5. Sarmos Technology;IETE Journal of Education;1979-10