Process Capability Analysis Methodologies for Zero-Bound, Non-Normal Process Data
Author:
Publisher
Informa UK Limited
Subject
Industrial and Manufacturing Engineering,Safety, Risk, Reliability and Quality
Link
http://www.tandfonline.com/doi/pdf/10.1080/08982110802643173
Reference38 articles.
1. The Lognormal Distribution for Modeling Quality Data When the Mean is near Zero
2. X̄andRControl Charts for Skewed Populations
3. Application of non-normal process capability indices to semiconductor quality control
4. Evaluation of Non-Normal Process Capability Indices Using Burr's Distributions
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3. Model‐based process capability indices: The dry‐etching semiconductor case study;Quality and Reliability Engineering International;2020-07-16
4. Parametric bootstrap process capability index control charts for both mean and dispersion;Communications in Statistics - Simulation and Computation;2018-11-04
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