Index of refraction of Ag-doped As33S67 films: Measurement and analysis of dispersion-Reference-Cited by-同舟云学术

Index of refraction of Ag-doped As33S67 films: Measurement and analysis of dispersion

Published:1995-03 Issue:3 Volume:71 Page:311-318
ISSN:1364-2812
Container-title:Philosophical Magazine B
language:en
Short-container-title:Philosophical Magazine B

Author:

Kosa T. I.¹,Wagner T.²,Ewen P. J. S.³,Owen A. E.³

Affiliation:

1. a Research Institute for Solid State Physics , Budapest , Hungary

2. b Department of General and Inorganic Chemistry , University of Chemical Technology , Pardubice , Czech Republic

3. c Department of Electrical Engineering , Edinburgh University , Edinburgh , Scotland

Publisher

Informa UK Limited

Subject

General Physics and Astronomy,General Chemical Engineering

Link

https://www.tandfonline.com/doi/pdf/10.1080/13642819508239036

Reference17 articles.

1. Photodissolution of metals in chalcogenide glasses: A unified mechanism

2. Compositional dependence of photodissolution kinetics in amorphous AsS films

3. Firth , A. P. Ewen , P. J. S. and Owen , A. E. 1983. The Structure of Non-Crystalline Materials, Edited by: Gaskell , P. A. Parker , J. M. and Davis , E. A. 268London: Taylor & Francis.

4. Structure and bonding in photodiffused amorphous Ag-GeSe2thin films

5. Gould , R. O. 1993, 1985. “private communication. Crystal structure data available from Inorganic Crystal Structure Data, Institute of Inorganic Chemistry, University of Bonn, and the Gmelin Institute, were used in the CALC Program for Molecular Geometry”. Edited by: Could , R. O. and Taylor , D. University of Edinburgh.

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